发明名称 Automation of tie cell insertion, optimization and replacement by scan flip-flops to increase fault coverage
摘要 A method for designing an integrated circuit is disclosed. The method generally comprises the steps of (A) splitting a design layout of the integrated circuit into a plurality of tiles, (B) adding a plurality of tie-to cells to the design layout, wherein at least one of the tie-to cells generating a tie-to signal at a particular logical level is added into each of the tiles having at least one gate with an input fixed to the particular logical level and (C) routing the tie-to signal to each of the inputs within each of the tiles.
申请公布号 US7546568(B2) 申请公布日期 2009.06.09
申请号 US20050311515 申请日期 2005.12.19
申请人 LSI CORPORATION 发明人 DIRKS JUERGEN;DINTER MATTHIAS;LEUCHTER RALF
分类号 G06F17/50;G06F7/38 主分类号 G06F17/50
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