发明名称 |
Two-step chemical mechanical polishing process |
摘要 |
A chemical mechanical polishing method is disclosed. The method includes forming a film on a wafer having at least one trench structure thereon; polishing the surface of the film by providing a polishing composition to provide a first polished surface; rinsing the first polished surface with a rinse composition to provide a rinsed surface; and polishing the rinsed surface by providing a second polishing composition to provide a second polished surface.
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申请公布号 |
US7544618(B2) |
申请公布日期 |
2009.06.09 |
申请号 |
US20060419129 |
申请日期 |
2006.05.18 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
CHEN CHUN-FU;HUNG YUNG-TAI;HUANG CHI-TUNG;YANG YUN-CHI |
分类号 |
H01L21/302;H01L21/461 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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