发明名称 Two-step chemical mechanical polishing process
摘要 A chemical mechanical polishing method is disclosed. The method includes forming a film on a wafer having at least one trench structure thereon; polishing the surface of the film by providing a polishing composition to provide a first polished surface; rinsing the first polished surface with a rinse composition to provide a rinsed surface; and polishing the rinsed surface by providing a second polishing composition to provide a second polished surface.
申请公布号 US7544618(B2) 申请公布日期 2009.06.09
申请号 US20060419129 申请日期 2006.05.18
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 CHEN CHUN-FU;HUNG YUNG-TAI;HUANG CHI-TUNG;YANG YUN-CHI
分类号 H01L21/302;H01L21/461 主分类号 H01L21/302
代理机构 代理人
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