TEST CARRIER AND APPARATUS FOR TESTING AN OBJECT INCLUDING THE SAME

摘要

A test carrier and a teat device including the same are provided to support a first surface and a second surface of a semiconductor package by using a first support member and a second support member to operate independently. A subject is received in an opening(112) of a carrier body(110). A first support member(120) is rotatably connected to the carrier body. The first support member selectively supports the first surface of the subject. The second support member is rotatably connected to the carrier body. The second support member operates independently with regard to the first support member. The second support member supports the second surface of the subject opposite to the first surface.