| 摘要 |
<p>A method is disclosed for detecting a change in shape of a continuous substrate, the method comprising providing a continuous substrate continuously moving through a measurement zone, providing an optical position sensor in optical communication with at least a portion of the measurement zone, irradiating at least a portion of the continuous substrate within at least a portion of the measurement zone with laser radiation and detecting a reflection of the laser radiation, and then determining a distance between the irradiated portion of the continuous substrate and the optical position sensor.</p> |
