发明名称 WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a dummy wafer which has a high corrosion resistance against a cleaning gas and an etching gas which are highly corrosive, and can be used for a long period. <P>SOLUTION: The wafer has a rare-earth oxide-sprayed film on the uppermost layer of a substrate. The wafer can prevent reduction in thickness of a semiconductor wafer in cleaning and stabilizing a plasma etching apparatus and a plasma deposition apparatus, and can improve its service life, if used as a dummy wafer, because it has high film hardness. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009124129(A) 申请公布日期 2009.06.04
申请号 JP20080272592 申请日期 2008.10.23
申请人 SHIN ETSU CHEM CO LTD 发明人 TSUKATANI TOSHIHIKO;KONYA MASARU;HAMAYA NORIAKI;NAKANO TAMA;MAEDA TAKAO
分类号 H01L21/66;C23C4/10 主分类号 H01L21/66
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