| 摘要 |
<P>PROBLEM TO BE SOLVED: To highly accurately measure polarization characteristics of an elliptically polarizing plate in which a polarizing plate and a retardation plate are attached to each other in such a manner that the transmission axis of the polarizing plate and the slow axis of the retardation plate are parallel or orthogonal to each other. <P>SOLUTION: A method of analyzing polarization comprises: a step of causing a detector 6 to rotate one rotation while withdrawing a polarizer 3 and a wavelength plate 4 from an optical path of light to be measured, and checking a transmission axis azimuth ψp of the polarizing plate 5a of the elliptically polarizing plate 5; a step of fixing the transmission axis of the detector 6 to ψp; a step of causing the polarizer 3 to rotate one rotation while arranging the polarizer 3 and the wavelength plate 4 on the optical path of the light to be measured and fixing the slow axis of the wavelength plate 4 to ψp+45°, and measuring a detected light intensity change I(θ) to determine ellipticity α and elliptic azimuth angle Ψ; a separate step of performing calculation while changing retardation R1 and attachment angle ψ1 of a retardation plate 5b with the calculation; and a step of calculating the total α and Ψ of the polarizing plate 5a, retardation plate 5b and wavelength plate 4 with respect to respective R1 and ψ1, and determining the R1 and ψ1 when getting to the closest to the α and Ψ obtained in the measurement from among the calculation result, whereby the ψ1 can be used as an attachment deviation angle of the elliptically polarizing plate 5. <P>COPYRIGHT: (C)2009,JPO&INPIT |
