| 摘要 |
A test apparatus that test a device under test includes a plurality of signal input/output units each of which has a signal output section and a signal input section that: firstly, adjusts each of the signal input/output units such that the phase difference between a time at which the signal output section outputs a signal and a time at which the signal input section inputs the signal is substantially the same as that of the other input/output units; next, detects, in the state that the plurality of signal input/output units are connected to each other, the amount of shift to shift the signal input timing in order to input the signal outputted by the first signal output section by the second signal input section and the amount of shift to shift the signal input timing in order to input the signal outputted by the second signal input section by the first signal input section; and then, adjusts such that the phases of the signal input/outputs between the first signal input/output unit and the second signal input/output unit are substantially equal to each other based on the those amount of shift.
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