发明名称 LENGTH MEASURING METHOD BY COINCIDENCE METHOD OF LOW COHERENCE INTERFERENCE
摘要 PROBLEM TO BE SOLVED: To provide a length measuring method capable of determining accurately a position of an interference fringe without being influenced by amplitude fluctuation of the interference fringe. SOLUTION: A size measuring method utilizing a tandem low coherence interferometer 1 wherein a measuring interferometer 3 is connected to a reference interferometer 4 through an optical fiber 5, which is a high-precision length measuring method by a coincidence method of low coherence interference, is characterized as follows: two wavelengths having each different center wavelength are input into the tandem low coherence interferometer 1 by a low coherence light source; each interference fringe on two points (a gage surface and a base plate surface) of a block gage 2 to be measured is formed relative to the two respective wavelengths; each phase of mutually corresponding interference fringes on the two points is measured; and a distance between the two points of a measuring object is determined by a combination of phases of mutually most coincident values relative to the phases measured respectively with respect to the two respective wavelengths. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009115486(A) 申请公布日期 2009.05.28
申请号 JP20070285987 申请日期 2007.11.02
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 MATSUMOTO KOICHI;HIRAI AKIKO;SASAKI KAORU
分类号 G01B9/02;G01B11/02 主分类号 G01B9/02
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