发明名称 TREATMENT SYSTEM FOR FLAT SUBSTRATES
摘要 Disclosed is a reactor for treating flat substrates, comprising a vacuum chamber (11) and a process chamber (9). A first electrode (5) and a counter electrode (7) which form two opposite walls of the process chamber are provided for generating a plasma. The counter electrode can accommodate the substrate (3). The reactor further comprises means for introducing (19, 23, 25) and evacuating gaseous material into and/or from process chamber, an inlet and outlet for the vacuum chamber, and a mechanism (41, 43) for varying the relative distance between the electrodes, a first relatively great distance being used when the process chamber is loaded and discharged and a second relatively short distance being used when the treatment is performed, and/or a device which is associated with the counter electrode, is used for accommodating substrates, and is designed such that the substrate is disposed at an angle alpha ranging from 0° to 90°, preferably at an angle of 1°, 3°, 5°, 7°, 9°, 11°, 13°, 15°, 17°, 20°, 25°, 30°, 40°, 45°, relative to the vertical direction at least while the treatment is performed, the substrate surface that is to be treated facing downward.
申请公布号 WO2009003552(A3) 申请公布日期 2009.05.28
申请号 WO2008EP03414 申请日期 2008.04.28
申请人 LEYBOLD OPTICS GMBH;GEISLER, MICHAEL;MERZ, THOMAS;ROEDER, MARIO 发明人 GEISLER, MICHAEL;MERZ, THOMAS;ROEDER, MARIO
分类号 H01J37/32;C23C14/56;H01L21/00;H01L21/677 主分类号 H01J37/32
代理机构 代理人
主权项
地址
您可能感兴趣的专利