发明名称 WIRELESS ILLUMINATION SENSING ASSEMBLY
摘要 PROBLEM TO BE SOLVED: To provide a system that easily and accurately measures the illumination levels that are directed on wafers during a photolithography process in wafer fabrication. SOLUTION: A wireless illumination sensing assembly for sensing a property of illumination within a semiconductor processing environment is provided. The sensing assembly has a power source and a wireless communication module coupled to the power source. Measurement circuitry is also provided. At least one illumination sensor has an electrical characteristic that varies with the property of illumination. The illumination sensor(s) is/are coupled to the measurement circuitry. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009111379(A) 申请公布日期 2009.05.21
申请号 JP20080268737 申请日期 2008.10.17
申请人 CYBEROPTICS SEMICONDUCTOR INC 发明人 BONCIOLINI DENNIS J;SCHUDA FELIX J
分类号 H01L31/10 主分类号 H01L31/10
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