发明名称 |
REDUCTION OF ETCH-RATE DRIFT IN HDP PROCESS |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of filling narrow-width high-aspect-ratio gaps by an HDP-VCD process. SOLUTION: A processing chamber is seasoned by providing a flow of season precursors to the processing chamber. A high-density plasma is formed from the season precursors by applying at least 7,500 W of source power distributed with greater than 70% of the source power at a top of the processing chamber. A season layer having a thickness of at least 5,000Åis deposited at one point using the high-density plasma. Each of multiple substrates is transferred sequentially into the processing chamber to perform a process that includes etching. The processing chamber is cleaned between sequential transfers of the substrates. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009111350(A) |
申请公布日期 |
2009.05.21 |
申请号 |
JP20080230063 |
申请日期 |
2008.09.08 |
申请人 |
APPLIED MATERIALS INC |
发明人 |
WANG ANCHUAN;LEE YOUNG S;VELLAIKAL MANOJ;BLOKING JASON THOMAS;JEON JIN HO;MUNGEKAR HEMANT P |
分类号 |
H01L21/316;C23C16/02;C23C16/42;C23C16/44;C23C16/56;H01L21/3065;H01L21/31 |
主分类号 |
H01L21/316 |
代理机构 |
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主权项 |
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地址 |
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