发明名称 SEMICONDUCTOR DEVICE AND ITS FABRICATION PROCESS
摘要 PROBLEM TO BE SOLVED: To provide a minute semiconductor device exhibiting excellent element characteristics. SOLUTION: The semiconductor device has a semiconductor substrate, an isolation region consisting of an insulator in a trench formed in the semiconductor substrate, an active region including a semiconductor region surrounded by the insulator in a trench and a single crystal silicon layer formed thereon, a gate insulating film formed on the single crystal silicon layer, a gate electrode provided on the gate insulating film across the active region, and a diffusion layer provided in the active region on the opposite sides of the gate electrode. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009111020(A) 申请公布日期 2009.05.21
申请号 JP20070279094 申请日期 2007.10.26
申请人 ELPIDA MEMORY INC 发明人 MORIWAKI YOSHIKAZU
分类号 H01L29/78;H01L21/76;H01L21/8234;H01L27/08;H01L27/088 主分类号 H01L29/78
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