发明名称 ADVANCED CMOS USING SUPER STEEP RETROGRADE WELLS
摘要 The present invention is a method for forming super steep doping profiles in MOS transistor structures. The method comprises forming a carbon containing layer (110) beneath the gate dielectric (50) and source and drain regions (80) of a MOS transistor. The carbon containing layer (110) will prevent the diffusion of dopants into the region (40) directly beneath the gate dielectric layer (50).
申请公布号 US2009130805(A1) 申请公布日期 2009.05.21
申请号 US20090356371 申请日期 2009.01.20
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 BABCOCK JEFFREY A.;PINTO ANGELO;BALSTER SCOTT;HAEUSLER ALFRED;HOWARD GREGORY E.
分类号 H01L21/336;H01L21/265;H01L21/8238;H01L29/10;H01L29/36;H01L29/786 主分类号 H01L21/336
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