| 摘要 |
The invention describes a microstructure testing head (10) of the type comprising a plurality of contact probes (6) inserted in guide holes (4, 5) made in an upper guide (2) and in a lower guide (3), separated by an air gap (9). Advantageously, the testing head (10) according to the invention comprises at least one guide element (20) equipped with additional guide holes (21) for the passage of the contact probes (6) and made in the air gap (9) near to at least one of the upper and lower guides (2, 3). The invention also describes a method for assembling a microstructure testing head (10) made according to the invention. |
