发明名称 NON-VOLATILE MEMORY DEVICES AND METHDOS OF FORMING THE SAME
摘要 <p>In one embodiment, a semiconductor memory device includes a substrate having first and second active regions. The first active region includes a first source and drain regions and the second active region includes a second source and drain regions. A first interlayer dielectric is located over the substrate. A first conductive structure extends through the first interlayer dielectric. A first bit line is on the first interlayer dielectric. A second interlayer dielectric is on the first interlayer dielectric. A contact hole extends through the second and first interlayer dielectrics. The device includes a second conductive structure within the contact hole and extending through the first and second interlayer dielectrics. A second bit line is on the second interlayer dielectric. A width of the contact hole at a bottom of the second interlayer dielectric is less than or substantially equal to a width at a top of the second interlayer dielectric.</p>
申请公布号 KR20090050775(A) 申请公布日期 2009.05.20
申请号 KR20070117390 申请日期 2007.11.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SEL, JONG SUN;CHOI, JUNG DAL;CHUNG, JU HYUCK;LEE, CHOONG HO;CHOI, DONG UK;KANG, HEE SOO
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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