发明名称 METHOD FOR FORMING METAL FILM OR STACKED LAYER INCLUDING METAL FILM WITH REDUCED SURFACE ROUGHNESS
摘要 A method for forming a stacked layer with a reduced surface roughness that includes at least a metal film and an anti-reflection coating thereon is described. A sputtering process is conducted using a metal target to deposit a layer of metal on a substrate, wherein the DC power density over the sputtered surface of the metal target is set higher than 5 W/inch2, and the layer of metal has a thickness of 4000 Å or less. A cooling step is performed, and then an anti-reflection coating is deposited on the metal film at a temperature of 300° C. or lower.
申请公布号 US2009120785(A1) 申请公布日期 2009.05.14
申请号 US20090350971 申请日期 2009.01.09
申请人 UNITED MICROELECTRONICS CORP. 发明人 SHIH HUI-SHEN;WU CHUN-MING
分类号 C23C14/34 主分类号 C23C14/34
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