发明名称 Lithographic apparatus and device manufacturing method
摘要 A uniformity controller is arranged to control a profile of a radiation intensity along the length of a target portion of a substrate so as to substantially compensate for irradiation-induced variation of the profile with respect to time. The uniformity controller includes a variable filter interposed between the illumination system and the target portion and arranged to control the relative values of the intensity applied at a series of positions within the target portion of the substrate so as to substantially compensate for variation of the profile with respect to time. In this manner the radiation intensity is controlled at a series of positions within the target portion so as to compensate for variation of the intensity profile with time.
申请公布号 US7532308(B2) 申请公布日期 2009.05.12
申请号 US20050224309 申请日期 2005.09.13
申请人 ASML NETHERLANDS B.V. 发明人 BOUMAN WILLEM JAN
分类号 G03B27/54 主分类号 G03B27/54
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