CLOCK CONTROL CIRCUIT FOR TESTING OF SEMICONDUCTOR CIRCUIT, METHOD FOR CONTROLLING OF CLOCK FOR TESTING OF SEMICONDUCTOR CIRCUIT AND SEMICONDUCTOR DEVICE HAVING THE CLOCK CONTROL CIRCUIT,申请号KR20070112995-传众专利搜索

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发明名称	CLOCK CONTROL CIRCUIT FOR TESTING OF SEMICONDUCTOR CIRCUIT, METHOD FOR CONTROLLING OF CLOCK FOR TESTING OF SEMICONDUCTOR CIRCUIT AND SEMICONDUCTOR DEVICE HAVING THE CLOCK CONTROL CIRCUIT
摘要
申请公布号	KR20090047027(A)	申请公布日期	2009.05.12
申请号	KR20070112995	申请日期	2007.11.07
申请人	MTEK VISION CO., LTD.	发明人	MOON, KAB JU;KIM, YONG HWAN
分类号	G11C29/00;G11C7/22	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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