发明名称 BACK-TO-FRONT VIA PROCESS
摘要 A method performed on a semiconductor chip having a doped semiconductor material abutting a substrate involves creating a first via through at least a portion of the substrate extending from an outer side of the substrate towards the doped semiconductor material, the first via having a wall surface and a bottom, introducing a first electrically conductive material into the first via so as to create an electrically conductive path, creating a second via, aligned with the first via, extending from an outer surface of the doped portion of the semiconductor chip to the bottom, and introducing a second electrically conductive material into the second via so as to create an electrically conductive path.
申请公布号 WO2006138491(A3) 申请公布日期 2009.05.07
申请号 WO2006US23363 申请日期 2006.06.14
申请人 CUBIC WAFER, INC.;TREZZA, JOHN 发明人 TREZZA, JOHN
分类号 H01L21/4763 主分类号 H01L21/4763
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