发明名称 MASK BLANK AND METHOD FOR PRODUCTION OF IMPRINT MOLD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method for producing an imprint mold having a highly precise fine pattern formed thereon by using a mask blank. <P>SOLUTION: A mask blank has a thin film for the formation of a pattern formed on a light-permeable substrate. The thin film comprises an upper layer comprising a material containing Cr and nitrogen and a lower layer containing a compound mainly composed of Ta and comprising a material that can be etched by a dry etching process with a chlorine-containing gas. The upper layer and the lower layer of the thin film are etched by a dry etching process with a chlorine-containing gas that substantially contains no oxygen, and the substrate is etched by a dry etching process with a fluorine-containing gas, thereby producing an imprint mold. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009098689(A) 申请公布日期 2009.05.07
申请号 JP20080249233 申请日期 2008.09.26
申请人 HOYA CORP 发明人 SATO TAKASHI;KUREISHI MITSUHIRO
分类号 B29C33/38;B29C59/02;B81C99/00;G03F1/50;G03F1/54;G03F1/68;G03F1/80;H01L21/027 主分类号 B29C33/38
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