发明名称 APPARATUS AND METHOD FOR TEMPERATURE CHARACTERISTICS MEASUREMENT
摘要 PROBLEM TO BE SOLVED: To provide a technique for achieving highly accurate temperature control in a temperature characteristics measuring apparatus. SOLUTION: The temperature characteristics measuring apparatus measures the temperature characteristics of electronic components and is provided with an electronic component mounting plate 10 for mounting electronic components D; a master 100 for temperature measurement mounted similarly onto the electronic component mounting plate 10 to the electronic components D for outputting signals dependent on temperature; and a master temperature measuring device for measuring the temperature of the master 100 for temperature measurement, on the basis of output of the master 100 for temperature measurement. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009097968(A) 申请公布日期 2009.05.07
申请号 JP20070269258 申请日期 2007.10.16
申请人 AKIM KK 发明人 IMAI SHOUJIRO
分类号 G01R31/00;G01R31/26 主分类号 G01R31/00
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