发明名称 Semiconductor process residue removal composition and process
摘要 A residue remover for removing polymeric material and etch residue includes 2-(2-aminoethylamino)-ethanol and optionally another two-carbon atom linkage alkanolamine compound, gallic acid or catechol, water, a polar organic solvent, and hydroxylamine. A process for removing photoresist or other residue from a substrate, such as an integrated circuit semiconductor wafer including titanium metallurgy, includes the steps of contacting the substrate with the above composition for a time and at a temperature sufficient to remove the photoresist or other residue from the substrate. Use of 2-(2-aminoethylamino)-ethanol in the composition and process provides superior residue removal without attacking titanium or other metallurgy on the substrate. The composition preferably has a flash point greater than about 130° C.
申请公布号 US7528098(B2) 申请公布日期 2009.05.05
申请号 US20040995239 申请日期 2004.11.24
申请人 EKC TECHNOLOGY, INC. 发明人 LEE WAI MUN;IP KATY;DINH XUAN-DUNG;MALONEY DAVID JOHN
分类号 H01L21/302;C11D3/30;C11D7/32;C11D7/50;C11D11/00;G03F7/42;H01L21/304 主分类号 H01L21/302
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