发明名称 Improvements in or relating to SIFT-MS instruments
摘要 A method of improving the signal intensity of the precursor ions constrained in a carrier gas in the flow tube of a SIFT-MS instrument comprises the application of an electrical potential to the flow tube to lower the diffusive loss of ions within the flow tube. Also disclosed is a SIFT-MS (selected ion flow ass spectrometry) instrument having a flow tube and including a means to provide an electrical potential to the flow tube to lower the diffusive loos of ions within the flow tube.
申请公布号 NZ549911(A) 申请公布日期 2009.04.30
申请号 NZ20060549911 申请日期 2006.10.19
申请人 SYFT TECHNOLOGIES LIMITED 发明人 WILSON, PAUL FRANCIS;PECK, GEOFFREY CHARLES
分类号 (IPC1-7):H01J49/00;H01J49/04;H01J49/40 主分类号 (IPC1-7):H01J49/00
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