发明名称 |
Improvements in or relating to SIFT-MS instruments |
摘要 |
A method of improving the signal intensity of the precursor ions constrained in a carrier gas in the flow tube of a SIFT-MS instrument comprises the application of an electrical potential to the flow tube to lower the diffusive loss of ions within the flow tube. Also disclosed is a SIFT-MS (selected ion flow ass spectrometry) instrument having a flow tube and including a means to provide an electrical potential to the flow tube to lower the diffusive loos of ions within the flow tube.
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申请公布号 |
NZ549911(A) |
申请公布日期 |
2009.04.30 |
申请号 |
NZ20060549911 |
申请日期 |
2006.10.19 |
申请人 |
SYFT TECHNOLOGIES LIMITED |
发明人 |
WILSON, PAUL FRANCIS;PECK, GEOFFREY CHARLES |
分类号 |
(IPC1-7):H01J49/00;H01J49/04;H01J49/40 |
主分类号 |
(IPC1-7):H01J49/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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