| 摘要 |
A handler (1), equipped with a movable head (304) (suction pad (307)) for simultaneously holding and transferring a plurality of IC devices (2) to be tested, performs a first step for leaving an IC device (2) to be tested mounted on a customer tray (KST) at a position corresponding to a socket (40) at socket OFF in the customer tray (KST), holding only an IC device (2) to be tested mounted on a customer tray (KST) at a position corresponding to a socket (40) other than at socket OFF by means of the suction pad (307), and transferring the IC device (2) to be tested from the customer tray (KST) to a test tray (TST) without changing the arrangement when the plurality of IC devices (2) to be tested are transferred from a feeding customer tray (KST) to the test tray (TST), and a second step for transferring the IC device (2) to be tested left in the customer tray (KST) because it is located at a position corresponding to the socket (40) at socket OFF from the customer tray (KST) to the test tray (TST) at a position corresponding to the socket (40) other than at socket OFF. |
