发明名称 X-ray backscatter detection imaging modules
摘要 An inspection system for inspection of an object by means of penetrating radiation comprises a. an imaging enclosure characterized by an enclosing body; b. a source of penetrating radiation contained entirely within the body of the imaging enclosure for generating a beam of penetrating radiation; and c. a detector module, contained entirely within the body of the imaging enclosure, for generating a signal based both upon penetrating radiation scattered by contents of the object and any penetrating radiation naturally emitted by the contents. (61) Addition to 539824
申请公布号 NZ562090(A) 申请公布日期 2009.04.30
申请号 NZ20070562090 申请日期 2007.09.28
申请人 AMERICAN SCIENCE AND ENGINEERING, INC. 发明人 ADAMS, WILLIAM;CHALMERS, ALEX;GRODZINS, LEE;PERICH, LOUIS W;ROTHSCHILD, PETER
分类号 (IPC1-7):G01N23/20;G01V5/00 主分类号 (IPC1-7):G01N23/20
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