发明名称 ABNORMAL STATE DETECTION DEVICE AND ABNORMAL STATE DETECTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide an abnormal state detection device and an abnormal state detection method which can prognosticate various abnormalities of which source specification methods are not always evident. <P>SOLUTION: An abnormal state detection device (1) comprises: preparation processing means which periodically acquires state data indicating operation states of an information processor (3) from the information processor, stores in a storage device (11) at least one of the pieces of state data before an abnormality occurs in the information processor, and performs clustering by groups the pieces of stored state data into groups; data acquisition means for acquiring state data from the information processor; determination means for determining whether the acquired state data belongs to one of the groups; and output means for, when the determination means determines that the acquired state data belongs to one of the groups, outputting the determination result. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013011987(A) 申请公布日期 2013.01.17
申请号 JP20110143430 申请日期 2011.06.28
申请人 TOSHIBA CORP 发明人 HORINOUCHI TSUKASA
分类号 G06F11/34;G06F11/30 主分类号 G06F11/34
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