发明名称 FREQUENCY CHARACTERISTIC MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a frequency characteristic measuring device capable of easily comparing a plurality of the obtained measurement results. SOLUTION: A spectrum analyzer 100 contains at least a set of a local oscillator 22, a mixer 20, and an intermediate frequency filter 24, and includes a signal component extracting means for sweeping frequency of signal components extracting from input signals with a prescribed bandpass by changing an oscillation frequency of a local oscillator 22 within a prescribed frequency range; a measurement means containing a wave detection section 50 etc. to measure a characteristic value with respect to the extracted signal component; a display section 70 with a display screen capable of setting a plurality of display areas; and a display treatment section 60 to display each of a plurality of measurement results respectively on the plurality of display areas correspondingly and separately when the plurality of measurement results are obtained by the measurement means. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009092497(A) 申请公布日期 2009.04.30
申请号 JP20070263028 申请日期 2007.10.09
申请人 ADVANTEST CORP 发明人 KURITA HIROYUKI
分类号 G01R23/173 主分类号 G01R23/173
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