发明名称 Topcoat material and use thereof in immersion lithography processes
摘要 Disclosed is a topcoat composition comprising a polymer having a dissolution rate of at least 1500 Å/second in an aqueous alkaline developer, and at least one solvent. The topcoat composition can be used to coat a photoresist layer on a material layer on a substrate, for example, a semiconductor chip. Also disclosed is a method of forming a pattern in the material layer of the coated substrate.
申请公布号 US7521172(B2) 申请公布日期 2009.04.21
申请号 US20060380782 申请日期 2006.04.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DAVID ROBERT ALLEN;BROCK PHILLIP JOE;BURNS SEAN DAVID;GOLDFARB DARIO LEONARDO;MEDEIROS DAVID;PFEIFFER DIRK;PINNOW MATT;SOORIYAKUMARAN RATNAM;SUNDBERG LINDA KARIN
分类号 G03F7/20;C08F220/22;G03F7/26 主分类号 G03F7/20
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