| 摘要 |
There is disclosed a method for monitoring wall thickness of an object having an electrically conductive wall, using a pulsed eddy current probe, wherein the same location on the wall is inspected repeatedly over an extended period of time. The pulsed eddy current probe is arranged in a predetermined position relative to the inspection location. The wall thickness dm is determined from a signal Vm which is recorded as a function of time t and from which a characteristic value Phim is determined, which is used to determined the wall thickness. The measurements are corrected for the influence of temperature. The disclosed method is particularly suitable for determining the rate of corrosion at the inspection location.
|
