| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor tester capable of easily coping with data frame structure and readily changing the frame structure. SOLUTION: For this semiconductor tester, a test signal is given to a DUT (device under test), based on a signal to which a pattern signal generated by a pattern generating part 1 is associated to each pin of the DUT 5 at a pin selection part 2. The semiconductor tester comprises a frame generating part 8, which reconstructs the pattern signal to a frame structure corresponding to the DUT 5 and outputs the signal to the pin selection part 2. COPYRIGHT: (C)2009,JPO&INPIT
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