发明名称 AN APPARATUS FOR OBSERVING THE SURFACE OF A SAMPLE
摘要 <p>An apparatus for observing the appearance of a surface (2) of a sample (1) of semitransparent material, the apparatus comprising a light source (11) for illuminating at least a region of interest (16) of the surface of the sample (1) from a predetermined direction and means (14) for observing a response to the illumination of the region of interest (16), wherein the illuminated region (5) comprises the region of interest (16) and a region surrounding the region of interest (16). In this way the influence of emitted scattered light (32) on the accuracy of the observation of the appearance of the sample (1) is minimized.</p>
申请公布号 WO2009040732(A1) 申请公布日期 2009.04.02
申请号 WO2008IB53864 申请日期 2008.09.23
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;WADMAN, SIPKE 发明人 WADMAN, SIPKE
分类号 G01N21/55;A61B5/103;G01B11/30 主分类号 G01N21/55
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