发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 A semiconductor device and manufacturing method thereof are provided to distinguish data from errors by other causes and maintain the reliability of memorized data high. The first information bit is filled in the information block of the corresponding chip. Here, the first information bit is given to each chip. Each chip is included within 1 shot, the fractional area of the wafer. The second information bit is filled in the second information block of the chip. The second information bit is given at each shot within the wafer. The third information bit is filled in the third information block of the chip. The third information bit is given to the wafer.
申请公布号 KR20090031213(A) 申请公布日期 2009.03.25
申请号 KR20080077379 申请日期 2008.08.07
申请人 KABUSHIKI KAISHA HITACHI SEISAKUSHO(D/B/A HITACHI, LTD.) 发明人 KANDOU HIDEHIKO;SAKAMA ISAO
分类号 H01L21/66 主分类号 H01L21/66
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