发明名称 Semiconductor memory device with a stacked gate including a floating gate and a control gate
摘要 A semiconductor memory device comprises a first to a fourth semiconductor layer of a first conductivity type which are formed in a fifth semiconductor layer of a second conductivity type in such a manner that they are isolated from one another, memory cells each of which includes a first MOS transistor formed on the first semiconductor layer, a second and a third MOS transistor which are formed on the second and third semiconductor layers, respectively, a first metal wiring layer which connects the gate of the first MOS transistor to the source or drain of at least one of the second and third MOS transistors, and a first contact plug which connects the fourth semiconductor layer to the first metal wiring layer. The first wiring layer is in the lowest layer of the metal wiring lines connected to the gate of the first MOS transistor.
申请公布号 US7505324(B2) 申请公布日期 2009.03.17
申请号 US20060533051 申请日期 2006.09.19
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 UMEZAWA AKIRA;KAKIZOE KAZUHIKO
分类号 G11C16/04;H01L21/822;G11C11/24;H01L21/8234;H01L21/8247;H01L27/04;H01L27/088;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 G11C16/04
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