发明名称 Flexible circuit with micro-sized probe tips and a method of making the same
摘要 A flexible circuit includes a plurality of electrical traces and a plurality of probe tips directly formed thereto. The electrical traces are made of a first electrically conductive material and the probe tips are made of a second electrically conductive material that is harder than the first electrically conductive material. The first material is copper or a copper alloy and the second material is nickel or a nickel alloy, where the second material may be plated with gold. Portions of the probe tips are exposed to facilitate electrical contact with contact pads of another electrical circuit. The flexible circuit may also include a ground layer to facilitate electrical correction with another electrical circuit at relatively high frequencies.
申请公布号 US7504839(B2) 申请公布日期 2009.03.17
申请号 US20040956318 申请日期 2004.10.01
申请人 DELPHI TECHNOLOGIES, INC. 发明人 FEIGENBAUM HAIM;LE BAO Q.;HOANG LONG T.;BETZ ROBERT K.
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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