AUTO PROBE UNIT

摘要

An auto probe unit is provided to reduce loss due to damage of a device by minimizing a replacement operation of an operator. An auto probe unit includes a unit plate(100). The unit plate is mounted on a base plate(A/P) having a test section(A/P-1) mounted on a test device. The unit plate transfers data probe blocks(210) of a lighting test part and gate probe blocks to X-axis and Y-axis. The lighting test part is formed in a test region(110). The unit plate controls an individual pitch between each data probe block, and controls an individual pitch between each gate probe block. The data probe blocks and the gate probe blocks are contacted in a data line and a gate line of a LCD panel(300) of a test object loaded on a stage(400) of the test region.