发明名称 CHARGED PARTICLE BEAM IRRADIATION SYSTEM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a charged particle beam irradiation system which accurately measures vertical dose distributions of particle beam relative to the particle beam advancing direction within an irradiation object, and thus improves accuracy of controlling vertical irradiation dose relative to the particle beam advancing direction at each position within the irradiation object and secures desired dose distributions. <P>SOLUTION: The charged particle beam irradiation system has a two-dimensional dose monitor 212 and an irradiation controlling apparatus 300. A dose counter apparatus 304a measures an added dose for each region of a monitor plane of the two-dimensional dose monitor 212 by independently cumulative doses measured for each region of the monitor plane. A comparing section 306 outputs a control signal for stopping beam irradiation when the cumulative dose measured for each region of the monitor plane reaches a target dose predetermined for each region of the monitor plane so as to stop beam irradiation to a region reaching its target dose. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009050468(A) 申请公布日期 2009.03.12
申请号 JP20070220229 申请日期 2007.08.27
申请人 HITACHI LTD 发明人 NISHIUCHI HIDEAKI;FUJIMAKI HISATAKA;FUJII YUSUKE
分类号 A61N5/10;G01T1/29;G21K5/04 主分类号 A61N5/10
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