| 摘要 |
A testing apparatus for testing a device to be tested is provided with a controlling apparatus for controlling the testing apparatus; a pattern generator for generating a plurality of test patterns to be supplied to a plurality of input terminals of the device to be tested; a plurality of variable delay circuits for prescribing timing to give the test patterns to the corresponding input terminals, respectively; and a plurality of microcontrollers, which can perform, at the same time, measurement of a delay quantity of each variable delay circuit when a prescribed delay setting value is set, in accordance with an instruction given from the controlling apparatus, and storage of the prescribed delay setting values and the measured delay quantities in association with each other.
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