发明名称 Thermal analysis apparatus
摘要 A thermal analysis apparatus possesses has a cylindrical furnace tube axially inserted in a cylindrical heating furnace, and a pair of sample holders extending axially inside the furnace tube. The furnace tube is supported by two axially spaced groups of butting members, each group having three or more butting members that are disposed in circumferentially spaced-apart relationship on the outside of the furnace tube and that butt against the furnace tube to restrain positional deviation thereof in a radial direction while permitting expansion and contraction thereof in the axial direction during heating of the furnace tube by the heating furnace.
申请公布号 US7500779(B2) 申请公布日期 2009.03.10
申请号 US20070705669 申请日期 2007.02.13
申请人 SII NANOTECHNOLOGY INC. 发明人 TAKEUCHI TOSHITADA;HASUDA MASAKATSU
分类号 G01N25/00 主分类号 G01N25/00
代理机构 代理人
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