发明名称 Reflective layer buried in silicon and method of fabrication
摘要 A silicon wafer having a distributed Bragg reflector buried within it. The buried reflector provides a high efficiency, readily and accurately manufactured reflector with a body of silicon. A photodetector using the buried layer to form a resonant cavity enhancement of the silicon's basic quantum efficiencies and selectivity is provided. The DBR is created by bonding of two or more substrates together at a silicon oxide interface or an oxide-oxide interface. In the former, an hydrogen implant is used to cleave silicon just above the bond line. In the latter, the bonding is at the oxide layers.
申请公布号 US7501303(B2) 申请公布日期 2009.03.10
申请号 US20040790403 申请日期 2004.03.01
申请人 THE TRUSTEES OF BOSTON UNIVERSITY 发明人 UNLU M. SELIM;EMSLEY MATTHEW K.
分类号 H01L33/00;H01L21/00;H01L21/8242 主分类号 H01L33/00
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