发明名称 HIGH FREQUENCY DELAY CIRCUIT AND TEST APPARATUS
摘要 A high frequency delay circuit operable to output a high frequency signal delayed for a desired delay time. The high frequency delay circuit includes: a variable delay circuit operable to receive a reference signal of which a frequency is lower than the high frequency signal, and to output a delay reference signal delayed from the reference signal for the desired delay time in advance; and a multiplier operable to generate the high frequency signal, of which a frequency is a frequency of the delay reference signal multiplied by a predetermined value, and to output the generated high frequency signal at timing according to a phase of the delay reference signal.
申请公布号 US2009051347(A1) 申请公布日期 2009.02.26
申请号 US20070955230 申请日期 2007.12.12
申请人 ADVANTEST CORPORATION 发明人 OCHIAI KATSUMI;SEKINO TAKASHI
分类号 G01R23/175;G01R31/3183;G01R31/28;G01R31/319;H03K5/00;H03K5/06;H03K5/13;H03K5/135;H03L7/00;H03L7/093;H03L7/18 主分类号 G01R23/175
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