TEST SYSTEM AND DAUGHTER UNIT

摘要

A test unit for testing a device under test is provided with a test head including a test module for generating a test signal to be supplied to the device under test, a performance board mounted on the test head for transmitting the test signal generated by the test module, and a daughter unit detachably mounted on the performance board for transmitting the test signal from the performance board to the device under test, wherein the daughter unit has a socket to set the device under test, a daughter board to mount the socket, and a housing that stores the socket and the daughter board inside and includes a shield on a side of the daughter unit to shield the socket and the daughter board from a noise from the outside.