发明名称 NOISE ANALYZING METHOD FOR INTEGRATED CIRCUIT DEVICE, NOISE ANALYZING SYSTEM FOR INTEGRATED CIRCUIT DEVICE, INTEGRATED CIRCUIT DEVICE, ELECTRONIC EQUIPMENT, NOISE ANALYSIS PROGRAM FOR INTEGRATED CIRCUIT DEVICE, AND INFORMATION STORAGE MEDIUM
摘要 PROBLEM TO BE SOLVED: To provide a highly precise noise analyzing method which can be applied even to a largely scaled LSI. SOLUTION: This noise analyzing method of an integrated circuit device includes: calculating the peak value of supply currents running through a power supply line based on a netlist and a current calculation parameter (S10); calculating an element value on a power supply line based on layout data and an element value calculation parameter (S14); generating the equivalence circuit model of an integrated circuit device based on the element value on the power supply line (S16); generating the waveform model of the supply currents based on the peak value of the supply currents and the evaluation circuit model (S18); and performing noise analysis based on the waveform model of the supply currents (S20). COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009042905(A) 申请公布日期 2009.02.26
申请号 JP20070205551 申请日期 2007.08.07
申请人 SEIKO EPSON CORP 发明人 YAZAWA TAKAYUKI
分类号 G06F17/50;H01L21/82;H01L21/822;H01L27/04 主分类号 G06F17/50
代理机构 代理人
主权项
地址