发明名称 |
PROBE FOR ELECTRICAL TEST AND ELECTRICAL CONNECTING APPARATUS USING IT |
摘要 |
A probe includes an arm region extending in the back and forth direction, and a tip region extending downward from the front end portion of the arm region. The tip region has a pedestal portion integrally continuous to a lower edge portion at the front end side of the arm region and having an underside inclined to an imaginary axis extending in the vertical direction; and a contact portion projected from the underside of the pedestal portion and having a tip orthogonal to an imaginary axis. Thus, the position of the tip can be accurately determined.
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申请公布号 |
US2009051382(A1) |
申请公布日期 |
2009.02.26 |
申请号 |
US20050817493 |
申请日期 |
2005.03.07 |
申请人 |
KABUSHIKI KAISHA NIHON MICRONICS |
发明人 |
KUNIYOSHI SHINJI;HIRAKAWA HIDEKI;SOMA AKIRA;HAYASHIZAKI TAKAYUKI |
分类号 |
G01R1/067 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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