发明名称 |
METHOD OF OPERATING A NON VOLATILE MEMORY DEVICE |
摘要 |
An operating method of a non-volatile memory device is provided to invert and latch a state in a sensing node while data are programmed and verified in a memory cell of a flash memory device having a multi-level cell. A bit line(BLe) is pre-charged according to a programming degree of a selected memory cell by inputting a positive voltage through a common source line of cell strings of memory cells. Data are stored in a first latch of a page buffer according to a voltage level of a sensing node(SO) which is changed according to a voltage level of a bit line. The data stored in the first latch are transmitted to a second latch through the sensing node.
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申请公布号 |
KR20090020467(A) |
申请公布日期 |
2009.02.26 |
申请号 |
KR20080044131 |
申请日期 |
2008.05.13 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
BAEK, KWANG HO;WON, SAM KYU;CHA, JAE WON |
分类号 |
G11C16/34;G11C16/06;G11C16/26 |
主分类号 |
G11C16/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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