发明名称 METHOD FOR MANUFACTURING THIN FILM INTEGRATED CIRCUIT, AND ELEMENT SUBSTRATE
摘要 Application form of and demand for an IC chip formed with a silicon wafer are expected to increase, and further reduction in cost is required. An object of the invention is to provide a structure of an IC chip and a process capable of producing at a lower cost. A feature of the invention is to use a metal film and a reactant having the metal film as a separation layer. An etching rate of the metal film or the reactant having metal is high, and a physical means in addition to a chemical means of etching the metal film or the reactant having metal can be used in the invention. Thus, the IDF chip can be manufactured more simply and easily in a short time.
申请公布号 US2009050964(A1) 申请公布日期 2009.02.26
申请号 US20080255117 申请日期 2008.10.21
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 DOZEN YOSHITAKA;TAMURA TOMOKO;TSURUME TAKUYA;DAIRIKI KOJI
分类号 H01L29/786;H01L21/304;H01L21/77;H01L21/84;H01L27/13;H01L27/28;H01R12/00 主分类号 H01L29/786
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