发明名称 Delay selecting circuit for semiconductor memory device
摘要 A delay selection circuit for use in a semiconductor memory device prevents a tAA from increasing at a read operation due to a delayed command type of signal. The delay selection circuit includes a delay line unit, a power supply voltage detection unit and a path selection unit. The delay line unit has two delay lines for delaying a command type of signal by different delay amounts. The power supply voltage detection unit detects a voltage level of a power supply voltage. The path selection unit selects one of each output of the two delay lines according to an output of the power supply voltage detection unit.
申请公布号 US7495974(B2) 申请公布日期 2009.02.24
申请号 US20060647669 申请日期 2006.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM KYUNG-WHAN
分类号 G11C8/18 主分类号 G11C8/18
代理机构 代理人
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