发明名称 Nor-type channel-program channel-erase contactless flash memory on SOI
摘要 A semiconductor device having an electrically erasable programmable read only memory (EEPROM) comprises a contactless array of EEPROM memory cells disposed in rows and columns and constructed over a silicon-on-insulator wafer. Each EEPROM memory cell comprises a drain region, a source region, a gate region, and a body region. The semiconductor device further comprises a plurality of gate lines each connecting the gate regions of a row of EEPROM memory cells, a plurality of body lines each connecting the body regions of a column of EEPROM memory cells, a plurality of source lines each connecting the source regions of a column of EEPROM memory cells, and a plurality of drain lines each connecting the drain regions of a column of EEPROM memory cells. The source lines and the drain lines are buried lines, and the source regions and the drain regions of a column of EEPROM memory cells are insulated from the source regions and the drain regions of the adjacent columns of EEPROM memory cells.
申请公布号 US7495283(B2) 申请公布日期 2009.02.24
申请号 US20050193653 申请日期 2005.08.01
申请人 WU KOUCHENG 发明人 WU KOUCHENG
分类号 H01L29/788;G11C11/56;G11C16/04;G11C16/34;H01L21/8247;H01L21/84;H01L27/115;H01L27/12 主分类号 H01L29/788
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