发明名称 METHOD FOR ELECTIVE SILICIDIFICATION OF THE SURFACE OF SILICON-BASED NANOWIRE AND SEMICONDUCTOR DEVICE USING THE NANOWIRE
摘要 A method for silicifying a surface of a silicon based nano wire selectively and a semiconductor device made by the same are provided to implement a high speed semiconductor device with a high integration and a low resistor by reducing a contact resistor when bonding a nano wire and a metal wire. One or more silicon nano wires(50) are arranged on a substrate(10). A mask pattern(90) is formed on an upper part of a silicon based nano wire. The mask pattern is made of the silicon oxide or the silicon nitride. A metal thin film(60) is stacked on the upper part of the mask pattern by a sputtering method or an atomic layer deposition method. A metal-silicide layer(70) is formed by a thermal process of a metallic thin film. The mask pattern is removed. The non-reactive metal surface is removed by using a wet etch process.
申请公布号 KR20090018743(A) 申请公布日期 2009.02.23
申请号 KR20070083082 申请日期 2007.08.18
申请人 INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY 发明人 KO, DAE HONG;KIM, SANG YEON;SOHN, HYUN CHUL;CHO, MANN HO
分类号 H01L21/24 主分类号 H01L21/24
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