发明名称 LOW TEMPERATURE DEPOSITION OF PHASE CHANGE MEMORY MATERIALS
摘要 <p>A system and method for forming a phase change memory material on a substrate, in which the substrate is contacted with precursors for a phase change memory chalcogenide alloy under conditions producing deposition of the chalcogenide alloy on the substrate, at temperature below 350°C, with the contacting being carried out via chemical vapor deposition or atomic layer deposition. Various tellurium, germanium and germanium-tellurium precursors are described, which are useful for forming GST phase change memory films on substrates.</p>
申请公布号 KR20090018629(A) 申请公布日期 2009.02.20
申请号 KR20087030213 申请日期 2007.03.12
申请人 ADVANCED TECHNOLOGY MATERIALS INC. 发明人 ROEDER JEFFREY F.;BAUM THOMAS H.;HENDRIX BRYAN C.;STAUF GREGORY T.;XU CHONGYING;HUNKS WILLIAM;CHEN TIANNIU;STENDER MATTHIAS
分类号 H01L21/20;H01L21/8247;H01L27/115 主分类号 H01L21/20
代理机构 代理人
主权项
地址