发明名称 Raster scanning light microscope with line pattern scanning and applications
摘要 Raster scanning light microscope with line pattern scanning with at least one illumination module, in which the means to achieve a variable partition of the laser light into least two illumination channels are envisioned and joint illumination of a sample takes place at the same or at different areas of the sample.
申请公布号 US2009046360(A1) 申请公布日期 2009.02.19
申请号 US20070987218 申请日期 2007.11.28
申请人 FUNK JOERG-MICHAEL;WOLLESCHENSKY RALF;ZIMMERMANN BERNHARD;WILHELM STEFAN;ENGELMANN RALF 发明人 FUNK JOERG-MICHAEL;WOLLESCHENSKY RALF;ZIMMERMANN BERNHARD;WILHELM STEFAN;ENGELMANN RALF
分类号 G02B21/06;G02B21/00 主分类号 G02B21/06
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