发明名称 |
Raster scanning light microscope with line pattern scanning and applications |
摘要 |
Raster scanning light microscope with line pattern scanning with at least one illumination module, in which the means to achieve a variable partition of the laser light into least two illumination channels are envisioned and joint illumination of a sample takes place at the same or at different areas of the sample.
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申请公布号 |
US2009046360(A1) |
申请公布日期 |
2009.02.19 |
申请号 |
US20070987218 |
申请日期 |
2007.11.28 |
申请人 |
FUNK JOERG-MICHAEL;WOLLESCHENSKY RALF;ZIMMERMANN BERNHARD;WILHELM STEFAN;ENGELMANN RALF |
发明人 |
FUNK JOERG-MICHAEL;WOLLESCHENSKY RALF;ZIMMERMANN BERNHARD;WILHELM STEFAN;ENGELMANN RALF |
分类号 |
G02B21/06;G02B21/00 |
主分类号 |
G02B21/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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